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Flexible FPGA based digital IC test development education laboratory design and application

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dc.contributor.author Grout, Ian
dc.date.accessioned 2020-10-08T08:07:48Z
dc.date.available 2020-10-08T08:07:48Z
dc.date.issued 2020
dc.identifier.uri http://hdl.handle.net/10344/9307
dc.description peer-reviewed en_US
dc.description.abstract In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 “IEEE Standard for Test Access Port and Boundary-Scan Architecture” is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment. en_US
dc.language.iso eng en_US
dc.publisher IEEE Computer Society en_US
dc.relation.ispartofseries 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON);pp.341-344
dc.relation.uri http://dx.doi.org/10.1109/ECTI-CON49241.2020.9158091
dc.rights © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. en_US
dc.subject test engineering en_US
dc.subject machine learning en_US
dc.subject JTAG en_US
dc.subject VHDL en_US
dc.subject FPGA en_US
dc.title Flexible FPGA based digital IC test development education laboratory design and application en_US
dc.type info:eu-repo/semantics/conferenceObject en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.identifier.doi 10.1109/ECTI-CON49241.2020.9158091
dc.rights.accessrights info:eu-repo/semantics/openAccess en_US


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