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High order mismatch shaping for low oversampling rates
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| dc.contributor.author | O'Brien, Vincent | |
| dc.contributor.author | Mullane, Brendan | |
| dc.date.accessioned | 2020-01-30T09:06:16Z | |
| dc.date.available | 2020-01-30T09:06:16Z | |
| dc.date.issued | 2020 | |
| dc.identifier.citation | O'Brien V.;Mullane B. (2020) 'High Order Mismatch Shaping for Low Oversampling Rates'. Ieee Transactions On Circuits And Systems Ii-Express Briefs, 67 (1):42-46. | en_US |
| dc.identifier.issn | 1549-7747 | |
| dc.identifier.uri | http://hdl.handle.net/10344/8451 | |
| dc.description | peer-reviewed | en_US |
| dc.description.abstract | Delta Sigma data converters employing high order dynamic element matching (DEM) allow for accurate signal conversion in the presence of DAC mismatch. However, at low oversampling rates, current high order DEM decoders provide little or no improvement in error suppression over lower order designs. In addition, the logic requirement of the DEM decoder increases significantly with each additional DAC bit. This brief presents a high order DEM decoder that improves mismatch shaping performance at low to medium oversampling rates by up to 15 dB, while employing methods to reduce the area overhead of the vector quantizer in the design. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | IEEE Computer Society | en_US |
| dc.relation.ispartofseries | IEEE Transactions on Circuits and Systems II: Express Briefs;67 (1), pp 42-46 | |
| dc.relation.uri | http://dx.doi.org/10.1109/TCSII.2019.2904180 | |
| dc.rights | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | en_US |
| dc.subject | ADC | en_US |
| dc.subject | DAC | en_US |
| dc.subject | decoder | en_US |
| dc.subject | delta sigma (ΠΣ) | en_US |
| dc.subject | DEM | en_US |
| dc.subject | dynamic element matching | en_US |
| dc.subject | element selection logic | en_US |
| dc.subject | mismatch shaping | en_US |
| dc.subject | oversampling | en_US |
| dc.title | High order mismatch shaping for low oversampling rates | en_US |
| dc.type | info:eu-repo/semantics/article | en_US |
| dc.type.supercollection | all_ul_research | en_US |
| dc.type.supercollection | ul_published_reviewed | en_US |
| dc.date.updated | 2020-01-29T14:27:04Z | |
| dc.description.version | ACCEPTED | |
| dc.identifier.doi | 10.1109/TCSII.2019.2904180 | |
| dc.contributor.sponsor | SFI | |
| dc.contributor.sponsor | EI | |
| dc.relation.projectid | IP-2013-0271 | |
| dc.relation.projectid | 13/RC/2077 | |
| dc.rights.accessrights | info:eu-repo/semantics/openAccess | en_US |
| dc.internal.rssid | 2940376 | |
| dc.internal.copyrightchecked | Yes | |
| dc.identifier.journaltitle | Ieee Transactions On Circuits And Systems Ii-Express Briefs | |
| dc.description.status | peer-reviewed |
