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PIT-HOM: an extension of pitest for higher order mutation analysis

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Show simple item record Laurent, Thomas Ventresque, Anthony 2020-01-22T11:39:12Z 2020-01-22T11:39:12Z 2019
dc.description peer-reviewed en_US
dc.description.abstract Mutation testing is a well-known, effective, faultbased testing criterion. First order mutation introduces defects in the form of a single small syntactic change. While the technique has been shown to be effective, it has some limits. Higher order mutation, where the faults introduced include multiple changes, has been proposed as a way to address some of these limits. Although the technique has shown promising results, there is no practical tool available for the application and study of higher order mutation on Java programs. In this paper we present PIT-HOM, an extension of Pitest (PIT) for higher order mutation. Pitest is a practical mutation analysis tool for Java, applicable on real-world codebases. PITHOM combines mutants in a same class to create higher order mutants of user-defined orders, it runs the mutants and reports the results in an easy to process format. We validate PIT-HOM using two small Java programs and report its performance as well as some characteristics of the mutants it creates. en_US
dc.language.iso eng en_US
dc.publisher IEEE Computer Society en_US
dc.relation.ispartofseries 2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW;
dc.rights © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. en_US
dc.subject mutation analysis en_US
dc.subject tool en_US
dc.subject higher order mutation en_US
dc.subject pitest en_US
dc.title PIT-HOM: an extension of pitest for higher order mutation analysis en_US
dc.type info:eu-repo/semantics/conferenceObject en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.identifier.doi 10.1109/icstw.2019.00036
dc.contributor.sponsor SFI en_US
dc.relation.projectid 13/RC/2094 en_US
dc.rights.accessrights info:eu-repo/semantics/openAccess en_US

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