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A formal approach to reuse successful traceability practices in SPL projects

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Show simple item record Espinoza, Angelina Botterweck, Goetz Garbajosa, Juan 2011-02-04T16:28:12Z 2011-02-04T16:28:12Z 2010
dc.description peer-reviewed en_US
dc.description.abstract Software Product Line (SPL) Engineering has to deal with interrelated, complex models such as feature and architecture models, hence traceability is fundamental to keep them consistent. Commonly, a traceability schema must be started from scratch from project to project. To avoid that, useful traceability practices to solve day to day problems should be modeled explicitly and kept as part of the traceability knowledge gained, and then organizations can reduce time and effort in implementing traceability in new projects. This paper presents an approach for formalizing and reusing traceability practices in SPL Engineering. Using this formalization approach a traceability metamodel is defined, incorporating the particular traceability practices performed in SPL Engineering. Customized traceability methodologies for SPL projects will be systematically and formally generated from this metamodel. These resulting methodologies will have already incorporated the traceability knowledge proven as successful in previous projects, facilitating the reuse of such practices. In this paper, we focus specifically on the product derivation process, to show the advantages of this formalization approach to reuse traceability knowledge. en_US
dc.language.iso eng en_US
dc.publisher Association for Computing Machinery en_US
dc.relation.ispartofseries SAC '10 Proceedings of the 2010 ACM Symposium on Applied Computing;pp. 2352-2359
dc.subject traceability metamodeling en_US
dc.subject traceability methodology en_US
dc.subject software product lines en_US
dc.subject product derivation en_US
dc.subject feature configuration en_US
dc.subject knowledge reuse en_US
dc.title A formal approach to reuse successful traceability practices in SPL projects en_US
dc.type Conference item en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.type.restriction none en
dc.contributor.sponsor SFI
dc.contributor.sponsor CONACYT
dc.contributor.sponsor FLEXI
dc.contributor.sponsor MEC, Spain
dc.contributor.sponsor MITYC, Spain
dc.relation.projectid 03/CE2/I303_1
dc.relation.projectid projects OVAL/PM
dc.relation.projectid TIC2006-14840
dc.relation.projectid ITEA2 06022
dc.relation.projectid FIT-340005-2007-37

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