University of Limerick Institutional Repository

High resolution imaging with differential infrared absorption micro-spectroscopy

DSpace Repository

Show simple item record

dc.contributor.author Pita, Isabel A.
dc.contributor.author Hendaoui, Nordine
dc.contributor.author Liu, Ning
dc.contributor.author Kumbham, Mahendar
dc.contributor.author Tofail, Syed A.M.
dc.contributor.author Peremans, André
dc.contributor.author Silien, Christophe
dc.date.accessioned 2014-04-29T09:23:46Z
dc.date.available 2014-04-29T09:23:46Z
dc.date.issued 2013
dc.identifier.citation Pita, I,Hendaoui, N,Liu, N,Kumbham, M,Tofail, SAM,Peremans, A,Silien, C (2013) 'High resolution imaging with differential infrared absorption micro-spectroscopy'. Optics Express, 21 (22) :25632-25642. en_US
dc.identifier.uri http://hdl.handle.net/10344/3795
dc.description peer-reviewed en_US
dc.description.abstract Although confocal infrared (IR) absorption micro-spectroscopy is well established for far-field chemical imaging, its scope remains restricted since diffraction limits the spatial resolution to values a little above half the radiation wavelength. Yet, the successful implementations of below-the-diffraction limit far-field fluorescence microscopies using saturated irradiation patterns for example for stimulated-emission depletion and saturated structured-illumination suggest the possibility of using a similar optical patterning strategy for infrared absorption mapping at high resolution. Simulations are used to show that the simple mapping of the difference in transmitted/reflected IR energy between a saturated vortex-shaped beam and a Gaussian reference with a confocal microscope affords the generation of high-resolution vibrational absorption images. On the basis of experimentally relevant parameters, the simulations of the differential absorption scheme reveal a spatial resolution better than a tenth of the wavelength for incident energies about a decade above the saturation threshold. The saturated structured illumination concepts are thus expected to be compatible with the establishment of point-like point-spread functions for measuring the absorbance of samples with a scanning confocal microscope recording the differential transmission/reflection. (C) 2013 Optical Society of America en_US
dc.language.iso eng en_US
dc.publisher Optical Society of America en_US
dc.relation 280804 en_US
dc.relation.ispartofseries Optics Express;21 (22), pp. 25632-25642
dc.relation.uri http://dx.doi.org/10.1364/OE.21.025632
dc.rights This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.21.025632. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law. en_US
dc.subject structured-illumination microscopy en_US
dc.subject raman-scattering microscopy en_US
dc.subject theoretically unlimited resolution en_US
dc.subject depletion fluorescence microscopy en_US
dc.subject optical reconstruction microscopy en_US
dc.subject vibrational-energy relaxation en_US
dc.subject ground-state-depletion en_US
dc.subject synchrotron-radiation en_US
dc.subject confocal microscopy en_US
dc.subject diffraction-limit en_US
dc.title High resolution imaging with differential infrared absorption micro-spectroscopy en_US
dc.type info:eu-repo/semantics/article en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.date.updated 2014-04-29T08:19:29Z
dc.description.version PUBLISHED
dc.contributor.sponsor CERUNA-FUNDP en_US
dc.contributor.sponsor INSPIRE en_US
dc.contributor.sponsor HEA en_US
dc.contributor.sponsor ERC en_US
dc.relation.projectid 280804 en_US
dc.rights.accessrights info:eu-repo/semantics/openAccess en_US
dc.internal.rssid 1556051
dc.internal.copyrightchecked Yes
dc.description.status peer-reviewed


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search ULIR


Browse

My Account

Statistics