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Enhanced imaging from multiply scattered waves

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Show simple item record Gaburro, Romina Nolan, Clifford J. 2013-08-13T09:22:42Z 2013-08-13T09:22:42Z 2008
dc.description peer-reviewed en_US
dc.description.abstract Many imaging methods involve probing a material with a wave and observing the back-scattered wave. The back-scattered wave measurements are used to compute an image of the internal structure of the material. Many of the conventional methods make the assumption that the wave has scattered just once from the region to be imaged before returning to the sensor to be recorded. The purpose of this paper is to show how this restriction can be partially removed and also how its removal leads to an enhanced image, free of the artifacts often associated with the conventionally reconstructed image. en_US
dc.language.iso eng en_US
dc.publisher American Institute of Mathematical Sciences en_US
dc.relation.ispartofseries Inverse Problems and Imaging;2(2), pp. 225-250
dc.subject static object en_US
dc.subject microlocal analysis en_US
dc.title Enhanced imaging from multiply scattered waves en_US
dc.type info:eu-repo/semantics/article en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.contributor.sponsor SFI en_US
dc.relation.projectid 03/IN3/I401 en_US
dc.rights.accessrights info:eu-repo/semantics/openAccess en_US

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