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Using functional defect analysis as an input for software process improvement: initial results

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Show simple item record Toroi, Tanja Raninen, Anu Vainio, Hannu 2012-12-04T12:00:02Z 2012-12-04T12:00:02Z 2012
dc.description peer-reviewed en_US
dc.description.abstract In this paper we present how functional defect analysis can be applied for software process improvement (SPI) purposes. Software defect data is shown to be one of the most important available management information sources for SPI decisions. Our preliminary analysis with three software companies’ defect data (11653 defects in total) showed that 65% of all the defects are functional defects. To better understand this mass, we have developed a detailed scheme for functional defect classification. Applying our scheme, defects can be classified with accuracy needed to generate practical results. The presented scheme is at initial stages of validation and has been tested with one software company’s defect data consisting of 1740 functional defects. Based on the classification we were able to provide the case organization with practical improvement suggestions en_US
dc.language.iso eng en_US
dc.publisher Springer en_US
dc.relation.ispartofseries EuroSPI. Systems, Software and Services Process Improvement Communications in Computer and Information Science;301, pp. 181-192
dc.rights The original publication is available at en_US
dc.subject functional defects en_US
dc.subject defect data analysis en_US
dc.subject process improvement en_US
dc.title Using functional defect analysis as an input for software process improvement: initial results en_US
dc.type info:eu-repo/semantics/conferenceObject en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.contributor.sponsor TEKES en_US
dc.contributor.sponsor SFI en_US
dc.relation.projectid 70030/10 en_US
dc.relation.projectid 03/CE2/I303 en_US
dc.rights.accessrights info:eu-repo/semantics/openAccess en_US

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