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Browsing The Bernal Project by Author "Nakahara, S"

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Browsing The Bernal Project by Author "Nakahara, S"

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  • Mogili, Naga Vishnu V; Tanner, David A.; Nakahara, S (Wiley & Sons, 2016)
    Strained superlattices (SSLs) are typically found inside the p-n junction area of semiconductor devices and consist of very thin alternating layers of different material. There exists a small lattice mismatch between these ...
  • Nakahara, S; Tanner, David A.; Hudson, D.A; Magner, S; Redington, E; Hodnett, Benjamin K. (Royal Society of Chemistry, 2011)
    A transmission electron microscope was used to characterize a powder form of hexagonally-ordered mesoporous silica material. The structural symmetry built into this amorphous material allowed one to obtain three characteristic ...
  • Nakahara, S; Tanner, David A.; Khan, A.K; Robinson, J.S. (Maney Publishing, 2011)
    A TEM study has revealed, for the first time, the presence of small (similar to 3 nm in diameter) voids attached to T(1) (Al(2)CuLi) precipitates present in an artificially aged Al-Cu-Li alloy (Al-2.90Cu-1.63Li-0.29Mg-0. ...
  • Hudson, Sarah P.; Tanner, David A.; Redington, Wynette; Magner, Edmond; Hodnett, Benjamin K.; Nakahara, S (Royal Society of Chemistry, 2006)
    TEM analysis of mesoporous materials is generally undertaken to give qualitative results. Accurate quantitative analysis is demonstrated in this study. A systematic image analysis of a powder form of a hexagonal mesoporous ...

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