Alamgir, Arbab; Bin A'ain, Abu Khari; Paraman, Norlina; Sheikh, Usman Ullah; Grout, Ian
(Bülent Ecevit University, 2018)
Determination of the most appropriate test set is critical for high fault coverage in testing of digital integrated
circuits. Among black-box approaches, random testing is popular due to its simplicity and cost effectiveness. ...