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Browsing Electronic & Computer Engineering by Author "Bin A'ain, Abu Khari"

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Browsing Electronic & Computer Engineering by Author "Bin A'ain, Abu Khari"

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  • Alamgir, Arbab; Bin A'ain, Abu Khari; Paraman, Norlina; Sheikh, Usman Ullah; Grout, Ian (Bülent Ecevit University, 2018)
    Determination of the most appropriate test set is critical for high fault coverage in testing of digital integrated circuits. Among black-box approaches, random testing is popular due to its simplicity and cost effectiveness. ...
  • Alamgir, Arbab; Bin A'ain, Abu Khari; Sheikh, Usman Ullah; Paraman, Norlina; Mokji, Musa Mohd; Grout, Ian (IEEE, 2019)
    Among the black-box approaches to digital circuit testing, Random testing is popular due to its simplicity and cost effectiveness. Unfortunately, available evidences suggest that Random testing is equipped with a number ...

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