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A complexity reliability model.

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Show simple item record Schneidewind, Norman Hinchey, Mike 2012-01-17T17:10:50Z 2012-01-17T17:10:50Z 2009
dc.description non-peer-reviewed en_US
dc.description.abstract A model of software complexity and reliability is developed. It uses an evolutionary process to transition from one software system to the next, while complexity metrics are used to predict the reliability for each system. Our approach is experimental, using data pertinent to the NASA satellite systems application environment. We do not use sophisticated mathematical models that may have little relevance for the application environment. Rather, we tailor our approach to the software characteristics of the software to yield important defect-related predictors of quality. Systems are tested until the software passes defect presence criteria and is released. Testing criteria are based on defect count, defect density, and testing efficiency predictions exceeding specified thresholds. In addition, another type of testing efficiency—a directed graph representing the complexity of the software and defects embedded in the code—is used to evaluate the efficiency of defect detection in NASA satellite system software. Complexity metrics were found to be good predictors of defects and testing efficiency in this evolutionary process. en_US
dc.language.iso eng en_US
dc.publisher IEEE Computer Society en_US
dc.relation.ispartofseries 20th IEEE International Symposium on Software Reliability Engineering;2009 pp 166-168
dc.rights “© 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. en_US
dc.subject software complexity en_US
dc.subject software systems en_US
dc.subject NASA satelite system en_US
dc.title A complexity reliability model. en_US
dc.type Conference item en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.type.restriction restricted en
dc.contributor.sponsor SFI
dc.relation.projectid 03/CE2/I303_1

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