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Random depth access full-field heterodyne low-coherence interferometry utilizing acousto-optic modulation and a complementary metal-oxide semiconductor camera

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dc.contributor.author Egan, Patrick
dc.contributor.author Connelly, Michael J.
dc.contributor.author Lakestani, Fereydoun
dc.contributor.author Whelan, Maurice P.
dc.date.accessioned 2011-07-22T11:42:13Z
dc.date.available 2011-07-22T11:42:13Z
dc.date.issued 2006
dc.identifier.uri http://hdl.handle.net/10344/1176
dc.description peer-reviewed en_US
dc.description.abstract With analog scanning, time-domain low-coherence interferometry lacks precise depth information, and optical carrier generation demands a linear scanning speed. Full-field heterodyne low-coherence interferometry that uses a logarithmic complementary metal-oxide semiconductor camera, acousto-optic modulation, and digital depth stepping is reported, with which random regions of interest, lateral and axial, can be accessed. Furthermore, nanometer profilometry is possible through heterodyne phase retrieval of the interference signal. The approach demonstrates inexpensive yet high-precision functional machine vision offering true digital random access in three dimensions. en_US
dc.description.sponsorship EI 18697-2001-11 SOSC ISP IE en_US
dc.language.iso eng en_US
dc.publisher Optical Society of America en_US
dc.relation.ispartofseries Optics Letters;31/ 7/ pp.912-914
dc.subject interferometry en_US
dc.subject heterodyne en_US
dc.title Random depth access full-field heterodyne low-coherence interferometry utilizing acousto-optic modulation and a complementary metal-oxide semiconductor camera en_US
dc.type Article en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.type.restriction none en
dc.internal.rssid 2129282


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