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Full-field phase measurement by wavelength-tuning interferometry in the C-band

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dc.contributor.author Egan, Patrick
dc.contributor.author Lakestani, Fereydoun
dc.contributor.author Whelan, Maurice P.
dc.contributor.author Connelly, Michael J.
dc.date.accessioned 2011-07-21T09:17:01Z
dc.date.available 2011-07-21T09:17:01Z
dc.date.issued 2006
dc.identifier.uri http://hdl.handle.net/10344/1145
dc.description peer-reviewed en_US
dc.description.abstract Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm. en_US
dc.description.sponsorship EI 18697-2001-11 SOSC ISP IE en_US
dc.language.iso eng en_US
dc.publisher Society of Photo-Optical Instrumentation Engineers en_US
dc.relation.ispartofseries Optical Engineering;45/12/ pp. 120504-1 - 120504-3
dc.relation.uri http://dx.doi.org/10.1117/1.2401169
dc.subject interferometry en_US
dc.subject phase retrieval en_US
dc.subject phase measurement en_US
dc.title Full-field phase measurement by wavelength-tuning interferometry in the C-band en_US
dc.type Article en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.type.restriction none en
dc.internal.rssid 1129262


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