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Digital IC test development engineering teaching and learning in higher education

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dc.contributor.author Grout, Ian
dc.date.accessioned 2021-10-29T08:05:59Z
dc.date.available 2021-10-29T08:05:59Z
dc.date.issued 2021
dc.identifier.uri http://hdl.handle.net/10344/10715
dc.description peer-reviewed en_US
dc.description.abstract This paper will consider the role of technology in the laboratory for a new course (module) in integrated circuit (IC) test development engineering for fifth year students in a higher education programme of study in electronic and computer engineering. Engineering laboratories form an essential part of the higher education learning experience for students in the engineering disciplines. They allow for theoretical aspects of a subject to be experimented with, and in many cases, ideas suitably visualized. This is particularly important to support student learning and understanding. In the electronic and computer engineering disciplines, laboratories can take several different forms from hands-on computer coding through to physical electronic circuit design, build and test exercises. This paper will discuss the development of module, and the creation of a laboratory arrangement using the field programmable gate array (FPGA) for a range of possible teaching and learning scenarios that will focus on required industrial IC test activities. en_US
dc.language.iso eng en_US
dc.publisher IEEE Computer Society en_US
dc.relation.ispartofseries 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE);pp.1-6
dc.relation.uri http://dx.doi.org/10.1109/EAEEIE50507.2021.9530879
dc.rights © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. en_US
dc.subject IC test en_US
dc.subject education en_US
dc.subject laboratory en_US
dc.subject FPGA en_US
dc.title Digital IC test development engineering teaching and learning in higher education en_US
dc.type info:eu-repo/semantics/conferenceObject en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.identifier.doi 10.1109/EAEEIE50507.2021.9530879
dc.rights.accessrights info:eu-repo/semantics/openAccess en_US


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