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Testing FPGA based digital system using XILINX ChipScopeTM logic analyzer

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dc.contributor.author Arshak, Khalil
dc.contributor.author Jafer, Essa
dc.contributor.author Ibala, Christian Serge
dc.date.accessioned 2011-07-01T16:03:13Z
dc.date.available 2011-07-01T16:03:13Z
dc.date.issued 2006
dc.identifier.uri http://hdl.handle.net/10344/1069
dc.description peer-reviewed
dc.description.abstract This paper presents the use of Xilinx ChipScope Pro integrated logic analyzer for Field programmable gate arrays (FPGA) as a board- and system-level diagnostic tool. FPGA designs have become increasingly dense and complex. They are difficult to debug because more and more of the relevant signals are buried deep within the logic fabric. Access to signals in the FPGA, on board or in the system is very restricted whether troubleshooting is done in the lab or in the field. The Xilinx ChipScope™ Pro integrated logic analyzer has solved much of the problem at the FPGA level. In this work, ChipScopeTM has been used to test and verify a developed system that presents the digital core of a wireless sensor module and it has been implemented in (Spartan 3) based FPGA development board. en_US
dc.language.iso eng en_US
dc.publisher IEEE Computer Society en_US
dc.relation.ispartofseries ISSE '06. 29th International Spring Seminar on Electronics Technology, 2006.
dc.relation.uri http://dx.doi.org/10.1109/ISSE.2006.365129
dc.rights ©2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. en_US
dc.subject debugging en_US
dc.subject FPGA testing en_US
dc.title Testing FPGA based digital system using XILINX ChipScopeTM logic analyzer en_US
dc.type Conference item en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.type.restriction none en


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