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Gamma radiation dosimetry using Tellurium Dioxide thin film structures

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Show simple item record Arshak, Khalil Korostynska, Olga 2011-07-01T15:38:20Z 2011-07-01T15:38:20Z 2002
dc.description peer-reviewed
dc.description.abstract Thin films of Tellurium dioxide (TeO2) were investigated for γ-radiation dosimetry purposes. Samples were fabricated using thin film vapour deposition technique. Thin films of Te02 were exposed to a 60Co γ-radiation source at a dose rate of 6 Gγ/min at room temperature. Absorption spectra for TeO2 films were recorded and the values of the optical band gap and energies of the localized states for as-deposited and γ-irradiated samples were calculated. It was found that the optical band gap values were decreased as the radiation dose was increased. Samples with electrical contacts having a planar structure showed a linear increase in current values with the increase in radiation dose up to a certain dose level. The observed changes in both the optical and the electrical properties suggest that Te02 thin film may be considered as an effective material for room temperature real time γ-radiation dosimetry. en_US
dc.description.sponsorship EI
dc.language.iso eng en_US
dc.publisher IEEE Computer Society en_US
dc.relation.ispartofseries Sensors 2002;
dc.rights ©2002 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. en_US
dc.subject Gamma radiation en_US
dc.subject dosimetry
dc.subject thin films
dc.title Gamma radiation dosimetry using Tellurium Dioxide thin film structures en_US
dc.type Conference item en_US
dc.type.supercollection all_ul_research en_US
dc.type.supercollection ul_published_reviewed en_US
dc.type.restriction none en

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