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Browsing Departments Science and Engineering by Subject "vertical hamming distance"

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Browsing Departments Science and Engineering by Subject "vertical hamming distance"

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  • Alamgir, Arbab; Bin A'ain, Abu Khari; Paraman, Norlina; Sheikh, Usman Ullah; Grout, Ian (Bülent Ecevit University, 2018)
    Determination of the most appropriate test set is critical for high fault coverage in testing of digital integrated circuits. Among black-box approaches, random testing is popular due to its simplicity and cost effectiveness. ...

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