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Browsing Electronic & Computer Engineering by Author "McDonagh, Declan"

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Browsing Electronic & Computer Engineering by Author "McDonagh, Declan"

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  • Arshak, Khalil; Mihov, Miroslav; Arshak, Arousian; McDonagh, Declan; Sutton, D (IEEE Computer Society, 2004)
    Focused Ion Beam (FIB) lithography has significant advantages over the electron beam counterpart in terms of resist sensitivity, backscattering and proximity effects. Applying the Top Surface Imaging (TSI) principal to ...
  • Arshak, Khalil; Jafer, Essa; McDonagh, Declan (IEEE Computer Society, 2004)
    This paper presents a novel simulated model for a wireless data acquisition system. The system will read analogue information provided by two sensors and can be used for medical purposes. Real data has been obtained and a ...
  • Arshak, Khalil; Jafer, Essa; McDonagh, Declan (IEEE Computer Society, 2005)
    The aim of this study is to model and design an efficient wireless system that should be easy to integrate with other technologies or infrastructures at a low cost. The system is reading analog information recorded by a ...
  • Arshak, Khalil; Mihov, Miroslav; Arshak, Arousian; McDonagh, Declan; Pomeroy, Michael J. (IEEE Computer Society, 2001)
    The positive resist image by dry etching (PRIME) process is a high resolution lithography system incorporating electron beam exposure, silylation and dry development. The process steps in PRIME with Shipley SPRSOSA ...
  • Arshak, Arousian; Arshak, Khalil; McDonagh, Declan; Mathur, B.P. (IEEE Computer Society, 1995)
    This paper describes the modelling and simulation of two resolution enhancement techniques in lithography ; 1) phase shift mask (PSM) technology and 2) top surface imaging (TSI) with silylation and dry ...
  • Arshak, Khalil; Arshak, Arousian; Mihov, Miroslav; McDonagh, Declan (IEEE Computer Society, 2002)
    In this paper, liquid-phase silylation process for Top Surface Imaging Lithography systems incorporated e-beam exposure has been experimentally investigated using FT-IR spectroscopy, UV spectroscopy, SIM spectrometry ...

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